MOSFETs and Circuits for Cryogenic Characterization

Run reference : A35S15_3 - IC ams 0.35µm BiCMOS SiGe 4 ML S35D4M5 (datasheet)

A35S15_3 QNL2_SiGe

The chip contains bare transistors (CMOS/SiGe) and test circuits of an array of SiGe transistors (8x16) used to characterise and evaluate matching properties of the devices in a wide range of temperatures (4.2K to 300K). The chip also has various circuits, such as SiGe LNA, VCO, Gilbert Mixer, and so on, for test at very low temperature (4.2K).